Integrating AIDC in the Connected World at LabelExpo Americas
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Integrating AIDC in the Connected World at LabelExpo Americas

When: Wednesday, September 26, 2018
7:45 AM
Where: LabelExpo Americas | Stephenson Convention Center
Rosemont, Illinois 
United States
Contact: +1 724-742-4473

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Integrating AIDC in the Connected World Workshop | Complimentary!


AIM North America, the industry association for automatic identification technologies, has brought together a panel of industry experts to demonstrate how tracking and tracing applications support your corporate strategy. Attendees will learn how these technologies

  • drive costs down and improve efficiency
  • stay ahead of your competition
  • improve your supply chain management


Jeanne Duckett
Avery Dennison


Your Morning Dose of Data Capture Technologies

Take part in this session to get an insider’s perspective on the standards, trends and future opportunities with technologies like RFID, barcoding, blockchain, RTLS, IoT and more. 







Using Vision-based Inspection Technology to Help Assure 100% Label Accuracy

Inspecting product printed label contents is required to meet regulatory requirements in many industries, as well as to ensure accurate and legible information is available to stakeholders throughout the supply chain.  Vision based inspection systems can provide 100% automated inspection with no loss of label printing throughput.  This presentation will highlight typical inspection requirements and inspection solutions which can be implemented for a variety of labeling applications.






RAIN RFID - Factors to Consider for Successful Deployment

This presentation aims to discuss some of the challenges that are the present in the development and deployment of RAIN RFID tags and readers in the current RFID market with help real life successful application of the technology. It also highlights the factors effecting tag and reader sensitivity. This presentation also offers recommendations to improve the overall performance and reliability of RAIN tags and readers both in the development phase and during deployment of the project.









Felix Klebe 

Omron Automation      Americas   


Debangana Mukherjee

CISC Semiconductor Corporation





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